Expert in Electronic Packaging and LED's
Expert ID: 734284 Canada
Expert has reverse-engineered hundreds of LED's for Intellectual Property and trademark violations. She has conducted this work for failure analysis as well.
Expert has presented several workshops, seminars and webinars on LED technology.
Expert possesses in-depth knowledge of test or qualification standards, including: JEDEC, Telcordia, MIL-STD-883, MIL-STD-750, IPC-A-600, IPC-A-610, and IPC-9701.
Expert has applied this deep knowledge to the qualification, reliability testing and failure analysis of semiconductor devices: Si ICs, MMICs, Si discrete devices, compound semiconductors including GaN LEDs and HEMTs and SiC diodes.
A thought leader in analytical techniques for materials characterization, Expert possesses in-depth knowledge of the physics behind analytical techniques. She maintains contact with several laboratory facilities across the world with specialized instruments not traditionally available. Expert has direct access to a well equipped laboratory.
Expert is President of a laboratory specializing in analysis of semiconductor devices of all technologies. Most of the data in support of analysis is generated in-house.
|Year: 1979||Degree: PhD||Subject: Astronomy||Institution: U. of Toronto|
|Year: 1975||Degree: MSc||Subject: Astronomy||Institution: U. of Toronto|
|Year: 1973||Degree: BSc||Subject: Physics||Institution: U. de Montreal|
|Years: 2015 to Present||Employer: Undisclosed||Title: President||Department:||Responsibilities: Expert served in executive leadership and sold the company in 2015. She has remained as President since that time.|
|Years: 2002 to 2015||Employer: MuAnalysis Inc.||Title: President and CEO||Department:||Responsibilities: For over a decade, Expert was Founder, President and CEO of the company of which she remains President.|
|Years: 2000 to 2002||Employer: STMicroelectronics (Canada) Inc.||Title: Manager, Materials and Device Analysis.||Department: Centre for Microanalysis||Responsibilities: Manager, Materials and Device Analysis. This department, part of the Quality organization to STMicroelectronics, provides failure analysis, electron microscopy services, and materials analysis (5/15) in support of ST Ottawa operations.|
|Years: 1997 to 2000||Employer: Nortel Networks||Title: Manager, Materials and Structures Analysis.||Department: Centre for Microanalysis||Responsibilities: This department provides failure analysis, electron microscopy services, and materials analysis (5/15) in support of Nortel's Ottawa silicon fab. .|
|Years: 1982 to 1997||Employer: Nortel||Title: From Member of Scientific Staff to Senior Scientist||Department: Semiconductor division||Responsibilities: Expert assumed various responsibilities in support of the silicon fab.|
|Years: 1980 to 1982||Employer: Fairchild Camera and Instruments Corp.||Title: Sr, Research Engineer||Department: Memory fab||Responsibilities: Expert was responsible for process and device modeling.|
|Associations / Societies|
|Currently member of the IEEE ( life member) and SMTA.
Former member of the American Physical Society, the Optical Society of America, the Electrochemical Society, and the Material Research Society.
|Member of SAE G19A AS6171 (test methods for the detection of counterfeit components)
Member of IEC TC111 WG3 on RoHS
Member of the FRNTQ’s grant selection committee on Collaborative Research Programs
Member of the Selection Committee for University of Ottawa Dean of Science.
Member of NSERC’s selection committee for the Gerhard-Herzberg Canada Gold Medal and the Brockhouse Canada prize, the two most prestigious awards for R&D in Canada.
Member of NSERC’s grant selection committee on Collaborative Research Opportunities.
Member of selection committee for Prix Marie-Victorin (Gouv. du Québec). Re-invited, respectfully declined.
Member of NSERC’s grant selection committee on Condensed Matter Physics. Withdrew after the first year because of managerial workload.
Member of Queen's University Advisory Council on Engineering.
Invited to serve on NSERC's selection committee on Collaborative Project Grants. Respectfully declined.
Member of the NSERC strategic grant selection committee for Industrial Materials Products and Processes.
Member of the review committee for the proposed degree of Microelectronics Engineering, Université du Québec à Montréal.
Member of the organizing committee of the 5th and 8th Canadian Semiconductor Technology Conference.
Chairman and member of the organizing committee of the Science-Fun Summer Camp for elementary school children, a pilot project co-sponsored by Partners in Education, aimed at creating interaction networks between science professionals and elementary school teachers.
|Awards / Recognition|
|University of Toronto Open Fellowship
NSERC Postgraduate Scholarship, Gouv. du Québec, Bourse de l'enseignement supérieur
NSERC Postgraduate Scholarship
Gouv. du Québec, Bourse de l'enseignement supérieur
Reinhardt Travelling Awards
Gouv. du Québec, Bourse de l'enseignement supérieur
American Physical Society Industrial Post-Doctoral Fellowship. These fellowships are intended to broaden the contributions of physics and physicists to industry. I chose to leave astronomy and enter the field of microelectronics. Held at Fairchild Camera and Instruments Corp.
NATO scholarship, summer school on Process and Device Modelling. Urbino, Italy
Appointed Adjunct Professor in the engineering-physics department at Ecole Polytechnique.
Medal of the Faculty of Arts and Sciences from U. de Montreal
|Publications and Patents Summary|
|Expert has authored several papers in refereed international journals, conference abstracts with review committee and over 70 conference presentations and seminars. Full publication list available on request.|
|Expert Witness Experience|
|Expert has worked with several law firms providing detailed reverse engineering reports in support of various intellectual property investigations on LEDs or semiconductor packaging. Expert has never been deposited or required to testify.|
|Training / Seminars|
|Expert has conducted seminars on LED's, their applications, and the related technology. She has also given seminars on Failure Analysis of electronic components. She presented at ISTFA in (Undisclosed)|
|Expert has worked with a large company on trademark violations of their product by identifying clones and counterfeits.|
|French||Mother tongue. Educated in French until BSc.|