Intellex Acquires Expert by Big Village

We're thrilled to announce that Intellex has acquired Expert by Big Village, effective March 22, 2024. This strategic move enhances our capabilities and strengthens our commitment to delivering exceptional solutions to our customers.

Stay tuned for more updates on how this acquisition will benefit our clients and experts.

For inquiries or more information, please contact us at info@intellex.com.

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Expert Details

Infrared Imaging

ID: 715225 Florida, USA

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INFRARED IMAGING: THERMAL IMAGING; INFRARED DETECTION SYSTEMS. Expert has worked with infrared imaging systems for the past 15 years. He is fully conversant on all subsystem components including optics, scanners, detectors, coolers, electronics, displays, and human interpretation of image quality. In addition, he is knowledgeable of image processing algorithms that optimize imagery. Expert characterized system performance for scanning, staring, push broom, and machine vision systems and is knowledgeable of state-of-the-art performance models. He created numerous new tests procedures and is familiar with all automated test systems. Expert performed laboratory measurements and compared predicted values to measured values. He can answer in-depth questions regarding all phases of designing, analyzing, testing, and predicting performance.

INFRARED IMAGING SYSTEM APPLICATIONS; NON-DESTRUCTIVE TESTING. Expert is familiar with numerous system applications such as target detection, remote sensing, non-destructive testing, law enforcement, pollution abatement, maintenance, industrial inspection, and medical uses. Expert has developed software that can analyze all imaging systems. He can select the best system for a client's application by taking into account resolution, sensitivity, wavelength (spectral response), atmospheric transmittance, and target characteristics. Expert invented the Standard Correlation Target Set(R) which evaluates the effectiveness of infrared image processing algorithms. He developed new test targets to measure interlace. He has characterized system performance, performed laboratory measurements, and compared predicted values to measured values. Expert developed a new eye model that has become the industry standard and is incorporated in FLIR92. He created numerous new test procedures and recommended an automatic minimum resolvable temperature (MRT) test procedure.

CCD CAMERAS; CCD ARRAYS; MACHINE VISION; IMAGE PROCESSING. Expert is knowledgeable of CCD array operations (interline transfer, progressive scan, frame transfer, time-delay-and-integrate, and line scanners) and a multitude of CCD camera applications. He has developed a software package that creates imagery that has been modified by component MTFs, corrupted by aliasing, and degraded by noise. The user-friendly, flexible software models both visible and infrared imaging systems. Expert can help clients sort through CCD array, CCD camera terminology, and predict camera performance. He will assist clients in selecting the best camera for their application.

ADVANCED TACTICAL AIR RECONNAISSANCE SYSTEM. Expert has analyzed, modeled, and tested the visible and infrared sensors used on the Advanced Tactical Air Reconnaissance System. He recommended new scan patterns that provided better ground coverage and identified image artifacts such as the bow-tie effect and image distortion effects. Expert implemented methods for image zoom without introducing additional image distortion. He related the Image Interpretability Rating Scale to a sensor's signal-to-noise ratio.


Provided consultation to numerous industrial and military agencies. Wrote significant technical sections of winning proposals. Studies included trade off analyses of 3-5 ìm versus 8-12 ìm thermal imaging systems, lasers, CCD cameras, and low light level TVs. Technical expert at design reviewsRecommended test techniques, equipment, and laboratory set up to evaulate visible and infrared systems

Education

Year Degree Subject Institution
Year: 1981 Degree: MEA Subject: Engineering Administration Institution: George Washington University
Year: 1968 Degree: PhD Subject: Physics Institution: University of Connecticut
Year: 1965 Degree: MS Subject: Electrical Engineering Institution: University of Connecticut
Year: 1963 Degree: BSEE Subject: Electrical Engineering Institution: Polytechnic University of New York

Work History

Years Employer Title Department
Years: 1993 to Present Employer: Undisclosed Title: President, Department:
Responsibilities:
Provide consultation to a variety of industries. Plan, organize, and direct the internationally acclaimed SPIE conference Infrared Imaging Systems: Design, Analysis, Modeling and Testing.Wrote significant technical sections of winning proposals. Studies included trade off analyses of 3-5 ìm versus 8-12 ìm thermal imaging systems, lasers, CCD cameras, and low light level TVs. Author of 9 books on imaging systems. Teach short courses.
Years Employer Title Department
Years: 1984 to 1994 Employer: Lockheed Martin Corporation Title: Senior Technical Staff, Department:
Responsibilities:
Principal investigator on numerous visible and infrared systems. Modeled infrared line scanners, push broom, staring and scanning E/O systems.Fully characterized thermal imaging system performance, performed laboratory measurements and compared predicted values to measured values. Recommended and implemented new test procedures.
Years Employer Title Department
Years: 1977 to 1984 Employer: Chemical Research and Development Center, Aberdeen Proving Ground; US Army Title: Chief, Obscuration Sciences Section Department:
Responsibilities:
Available upon request.
Years Employer Title Department
Years: 1968 to 1977 Employer: Frankford Arsenal Title: Principal Investigator, Department:
Responsibilities:
Available upon request.

Government Experience

Years Agency Role Description
Years: 1977 to 1984 Agency: US Army Role: Chief, Obscuration Sciences Section Description: Aberdeen Proving Ground

International Experience

Years Country / Region Summary
Years: 1978 to 1984 Country / Region: Europe Summary: Planned, organized and directed the summer (Bourges, France) and winter (Raufoss, Norway) NATO field trials. Coordinated the activities of the six participating national laboratories. These trials compared the effectiveness of anti-infrared smokes for the self screening of armored vehicles. Assimilated different test philosophies, overcame language barriers, and accommodated the differences between US and foreign formatted equipment.
Years: 1996 to 1997 Country / Region: Mid East Summary: Taught short courses and recommended test techniques and equipment
Years: 1999 to 2000 Country / Region: South Africa Summary: Taught short courses and recommended test techniques and equipment. Reviewed entire thermal imaging system program

Career Accomplishments

Associations / Societies
He is a member of IEEE, the Optical Society of America and the International Society for Optical Engineering (SPIE).
Professional Appointments
Expert has planned, organized, and directed the internationally acclaimed an SPIE conference on infrared imaging systems. In addition, he is an editorial board member for Infrared Physics and Technology. Expert is a technical referee for "Optical Engineering" and has taught seminars on electro-optical imaging systems at numerous symposia.
Awards / Recognition
Expert was awarded "Outstanding Engineer" and "Engineer of the Year" by the Orlando Chapter of the Institute of Electrical and Electronic Engineers (IEEE).

Additional Experience

Training / Seminars
Teach courses on sampling theory, infrared technology, infrared and visible imaging system performance, testing of visible and infrared systems. One course covers CCD terminology and specifications; sampling effects; analog and digital outputs; and the difference between camera output and frame grabber input requirements. Another course offered by Expert discusses the Nyquist frequency limit; the trade-off between MTF and aliasing; and aliasing in CCD cameras and commercial televisions. Additionally, the class teaches the difference between aliasing and incomplete reconstruction; helps understand why digital data can been "seen;" helps determine how many samples are adequate; and helps understand why test targets enhance aliasing.

another course offered by Expert describes all the quantitative and qualitative metrics used to characterize CCD arrays and solid state cameras. These include responsivity (sensitivity), number of pixels, resolution, random noise, uniformity, fixed pattern noise (FPN), and modulation transfer function (MTF). Another course covers using MTFs when analyzing an imaging system; resolution and sensitivity; scanning and starting array performance; applying MTF analyses to image quality metrics; understanding range performance predictions; and using trade-off analysis to optimize system performance. Lastly, Expert teaches a course that covers imaging system characterization and many other topics.
Vendor Selection
Expert has experience locating vendors of the following:
* Infrared cameras
* Infrared systems
* Infrared and visible imaging system test equipment
* Visible cameras
* CCD cameras
* CCD arrays.
Other Relevant Experience
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Fields of Expertise

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