Expert Details

Expert in On-Line Near Infrared Process Analysis, Chemometrics Analysis, and Applied Spectroscopy

Expert ID: 733558 New York, USA

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ON-LINE PROCESS ANALYSIS. Expert pioneered the development and use of on-line near infrared (NIR) process analysis for refinery and chemicals process monitoring at Exxon. His designs are the basis for a commercially available system and have been instrumental in products developed by several analyzer system suppliers. He has extensive in-plant experience, including analyzer installation and trouble shooting, as well as knowledge of analyzer system placement, selection, and benefits. While Expert has specialized in liquids and liquid fuels analysis, he is experienced in the measurement of solids, particulate slurries, and gas-phase systems.

REAL-TIME SPECTROSCOPIC ANALYSIS. Expert specializes in the use of spectroscopic measurements to monitor chemical reactions. Critical to these applications are the marriage of spectroscopic instrumentation and computerization. He is expert at this combination and the customization and optimization of both which are often required. He is experienced in real-time analysis of very slow reactions (days) to very fast reactions (nano-seconds).

CHEMOMETRICS (MULTIVARIATE) DATA ANALYSIS. Expert has over 25 years of experience applying computer techniques to the analysis of large, complex data sets. For the last twelve years, he has specialized in chemometrics analysis, both graphical and computational, for analysis of complex spectroscopic data and to develop robust multivariate chemical composition and property estimators for use with real-time spectroscopic analysis.

APPLIED SPECTROSCOPY. Expert has spent his entire career in the applications of spectroscopy for the determination of physical and chemical properties of complex materials and the real-time analysis of chemical reactions. A pioneer in dynamic light scattering spectroscopy for examining reactions leading to the formation of complex biochemical structures, Expert has also been active in transient spectroscopy, both laser and FT-IR. His areas of spectroscopic expertise include adsorption and reflection spectroscopy (FT-IR, NIR, UV-Vis), scattering (dynamic light scattering and small angle neutron scattering), and near infrared FT-Raman.

COMPUTERIZED DATA ACQUISITION & CONTROL. Expert has over 25 years experience with general purpose, laboratory, and plant computing. He has designed and installed some of the first systems for centralized inventory control and distribution, computer control of experiments, synchronized multi-instrument control and robust process analyzer control systems. He is an expert at open (generic) system design methods which allow system flexibility and technology upgrades in this rapidly changing hardware and software environment.

Expert may consult nationally and internationally, and is also local to the following cities: New York, New York - Yonkers, New York - Newark, New Jersey - Jersey City, New Jersey - Paterson, New Jersey - Elizabeth, New Jersey - Bridgeport, Connecticut - New Haven, Connecticut - Hartford, Connecticut - Philadelphia, Pennsylvania

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Year Degree Subject Institution
Year: 1976 Degree: Ph.D Subject: Physical Chemistry Institution: Columbia University
Year: 1973 Degree: M.Phil Subject: Physical Chemistry Institution: Columbia University
Year: 1968 Degree: BS Subject: Chemistry Institution: University of Chicago

Work History

Years Employer Title Department Responsibilities
Years: 1991 to Present Employer: Undisclosed Title: President and Founder Department: Responsibilities: Expert runs the company.
Years: 1978 to 1991 Employer: Exxon Research and Enginering Title: Technical Staff Department: Responsibilities: Expert was a Technical Staff member in the R&D department.
Years: 1976 to 1978 Employer: National Institutes of Health Title: Staff Fellow Department: Responsibilities: Expert was a Staff Fellow in the Research department.
Years: 1962 to 1968 Employer: IBM Corporation Title: Consultant Department: Responsibilities: Expert worked as a Consultant in the Technical Systems division.

Career Accomplishments

Associations / Societies
Expert is a member of the American Chemical Society (ACS), American Physical Society, Sigma Xi, Instrument Society of America (ISA), ASTM, ASQC, American Statistical Society, and Society for Applied Spectroscopy.
Awards / Recognition
He received the Best Oral Paper Award at the 1990 International Pyrolysis Conference, the 1990 Exxon Golden Tiger Award for the successful development of the NIR octane analyzer, and the R. A. Glenn Award for the best paper presented at the Fall 1986 ACS Fuel Division Symposia. He was also the recipient of an Exxon Distinguished Contribution Award in recognition of developing significant new methods for the study of coal.

Additional Experience

Vendor Selection
Expert has experience locating vendors of: FT-IR spectrometers, near infrared (NIR) spectrometers, infrared spectrometers, data analysis software, chemometric software, statistical analysis software, and analyzer and instrumentation engineering services. He has access to the following resources: printed material information files, and extensive personal contact network.
Other Relevant Experience
Expert also has some experience in the following: acquisition, adsorption, advanced process control, alcohol environmental effect, aliphatic-hydrocarbon environmental effect, American Society for Quality Control, American Society for Testing and Materials, analysis technique, analytical instrumentation design, anemometry, aromatic hydrocarbon environmental effect, benzene environmental effect, carboxylic acid environmental effect, cathode-ray oscilloscope, chemical sensor, chemistry, combination, computational method, crude oil environmental effect, curve fitting, design of experiments, diffuse reflectance spectroscopy, distribution, dynamic light scattering spectroscopy, electromagnetic radiation, electromagnetic radiation scattering, electrophoretic light-scattering spectroscopy, ether compound environmental effect, ethylbenzene environmental effect, ethylene oxide environmental effect, examination, fossil fuel environmental effect, humidity sensor, information file, infrared radiation energy, installation, instrumentation (equipment), inventory control system, ketone environmental effect, light scattering spectroscopy, measurement process, moisture sensor, monitor (instrument), monitoring, near-infrared radiation energy, new product development, octane, open-system architecture, optical radiation scattering, particle-size measurement, photothermal spectroscopy, piezoelectric transducer, process analysis, process control instrumentation, programmable controller, pyridine environmental effect, pyrolysis, specific material property, synfuel environmental effect, temperature sensor, toluene environmental effect, water physical chemistry, xylene environmental effect.

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