Expert in Pattern Recognition Technology
Expert ID: 716079 New York, USA
Expert's research has been concerned with the identification of objects, shapes or patterns from digitized images. He can evaluate feature extraction techniques for image analysis and their use designing pattern classifiers.
Expert has been an active contributor to information theory research. His work has centered on the area of source coding or data compression. The primary application has been in the efficient representation of line drawings.
Expert's research has focused on the problems of accurate methods of representing and reconstructing digital curves. He has devised algorithms for representing curves with subpixel accuracy. He has worked on methods to reconstruct the original curve from its digitized form, converting a low resolution digital curve into one with high resolution.
For the recognition of image objects it is generally necessary to segment or separate the object from the rest of the image. Expert's work includes methods for detecting and accurately determining the boundaries of objects for gray level as well as color images. Expert's currant research involves image edge detection. He has served as a reviewer in numerous journals for articles on edge detection.
Expert has a strong theoretical background in source coding and data compression of binary images.
|Year: 1973||Degree: PhD||Subject: Electrical Engineering||Institution: University of Colorado|
|Year: 1968||Degree: MEE||Subject: Electrical Engineering||Institution: Stanford University|
|Year: 1967||Degree: BEE||Subject: Electrical Engineering||Institution: City College of New York|
|Years: 1973 to Present||Employer: Undisclosed||Title:||Department: Electrical and Computer Engineering||Responsibilities:|
|Years: 1986 to 1987||Employer: Israel Institute of Technology||Title: Lady Davis Fellow||Department: Technion||Responsibilities:|
|Years: 1979 to 1980||Employer: Israel Institute of Technology||Title: Research Fellow||Department: Technion||Responsibilities:|
|Years: 1975 to 1978||Employer: StanfordUniversity||Title: Visiting Scholar||Department: Information Systems Laboratory||Responsibilities:|
|Years: 1967 to 1970||Employer: Bell Laboratories||Title: Technical Staff||Department:||Responsibilities:|
|Expert has served as Associate Editor for the IEEE Transactions on Information Theory. He is currently serving as an associate editor of the journal Pattern Recognition.|
|Awards / Recognition|
|He was nominated for the Information Theory Award based on his best paper in the pattern recognition area.|
|Publications and Patents Summary|
|He has been organizer and chairman for pattern recognition sessions at various technical conferences and is the author or co-author of over 40 publications.|
Fields of Expertise
cluster analysis, feature extraction, pattern recognition, computer vision, information theory, computer graphics process, image edge detection, image segmentation, data compression, color image, image restoration, image enhancement, statistical method, communication, image, character recognition technology, algebraic vector, artificial neural network, prediction theory, image processing, electronic filtering theory, digital signal processing, computer algorithm, classifier