Expert Details
Scanning Probe Microscopy (AFM, STM, Kelvin Probe)
ID: 729760
United Kingdom
Instrument developments:
UHV STM, combined UHV AFM/STM based on tuning fork sensor, STM/TEM instruments, Spin-polarized STM, shear-force and near-field SPM.
Theoretical calculations and numerical simulations:
Density Functional Theory calculations and their applications for study of surface and interfaces and STM data interpretation;
Molecular Dynamics Simulations and application for study of nanoscale processes and AFM data interpretation.
Cambridge University: AFM general training and AFM force spectroscopyUniversity of Sheffield:
Transmission Electron microscope vs Scanning Tunneling Microscope installation and training
Education
| Year | Degree | Subject | Institution |
|---|---|---|---|
| Year: 1997 | Degree: PhD | Subject: Physics | Institution: Kazan State University, Russia |
| Year: 1991 | Degree: MSc | Subject: Physics/Radio Physics | Institution: Kazan State University, Russia |
Work History
| Years | Employer | Title | Department |
|---|---|---|---|
| Years: 2010 to Present | Employer: Undisclosed | Title: Undisclosed | Department: Physics |
Responsibilities:Research in area of organic electronics. Device characterisation. Scanning Probe lab management. |
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| Years | Employer | Title | Department |
| Years: 2005 to 2009 | Employer: Univ. of Nottingham | Title: Undisclosed | Department: Physcs |
Responsibilities:Development of new ultra-high vacuum scanning probe. |
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| Years | Employer | Title | Department |
| Years: 2002 to 2005 | Employer: Trinity College Dublin | Title: Undisclosed | Department: Physics |
Responsibilities:Surface science/new material research. |
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Language Skills
| Language | Proficiency |
|---|---|
| Russian | Native |
| English | Fluent |
| French | Obtained through work experience |
Fields of Expertise
atomic force microscope, atomic-force microscopy, scanning probe microscope, scanning tunneling microscope, scanning tunneling microscopy, surface analysis, surface characterization, surface physics, surface property, surface science, surface structure, tunnel effect, nanofabrication, surface property measurement, materials science, surface roughness analysis, Auger electron spectroscopy