Expert in Thin Films, Coatings, and Instruments
Expert ID: 108235 New York, USA
Expert has performed quantitative and qualitative surface analysis for the characterization of thin films and materials. Some of the examples are WC, TiN, stainless steel, Indium (tin) oxide, silicon nitride, SeGe, CdS, and cemented carbide tool bits. Also, he has applied surface analytical techniques for the identification of corrosion products on stainless steel and copper-based alloys used in thermal and nuclear power plants. He has made a significant contribution in this area by modifying scanning Auger microprobe (SAM) to measure electron beam induced currents (EBIC) of semiconductor devices and solar cells.
Expert has prepared and characterized WC, electroless Ni-P, and TiN coatings. Recently, he performed a comprehensive study of the state-of-the-art of micro-hardness testing instruments, particularly their applicability to thin coatings. Also, he has studied and analyzed the variations in microhardness of electroless Ni-P coatings due to heat treatment and process conditions as part of product development for a manufacturer (consulting work).
Expert was the first to apply non-aqueous-based spectrophotometric techniques for the estimation of Cu, Fe, and Co in metal doped polymer films. He has conducted a feasibility (including systems design) study of colorimetry-based techniques for the on-line detection and estimation of low level inorganic (Pb) contaminants in water. He found that with the application of lasers, such detection methods can be used for the monitoring of sub ppb (parts per billion) level metal contaminants. This technique is far superior to the existing analytical techniques, such as atomic absorption spectroscopy.
Expert has designed and constructed vacuum systems from 10(-3) Torr to 10(-12) Torr (ultra high vacuum). These systems he has developed have been used for physical vapor deposition (PVD), in-situ measurements, and surface science experiments.
Expert has considerable experience with a wide range of coating processes, including screen printing, dipping, electroplating, electroless deposition, sputtering, and evaporation. He has solved particularly difficult technological problems in this area, such as poor adhesion, lack of uniformity, scaling up a coating process, and coating internal inaccessible surfaces.
Expert has developed a coating process for the inner surfaces of tubing, pipes, or pumps. The coating prevents corrosion and radioactive buildup on stainless steel when exposed to a boiling water reactor environment. The coatings were tested and found to reduce radioactive buildup by almost 90%. Expert coated the inner surface of a heat exchanger from end-to-end with a two to three micron thick layer.
Expert wrote a review article to be published on the state-of-the-art of contactless torque sensors. He has also performed experiments on the design of such torque sensors and their related instrumentation.
Expert may consult nationally and internationally, and is also local to the following cities: Rochester, New York - Syracuse, New York - Schenectady, New York - Utica, New York
|Year: 1978||Degree: PhD||Subject: Thin Films (Solid State)||Institution: Indian Institute ofTechnology Delhi, India|
|Year: 1973||Degree: MS||Subject: Physics||Institution: Andhra University, Waltair, India|
|Year: 1971||Degree: BS||Subject: Physics||Institution: Chemistry, Mathematics, AndhraUniversity, Waltair, India|
|Years: 1989 to Present||Employer: Undisclosed||Title: Founder||Department:||Responsibilities:|
|Years: 1983 to 1988||Employer: Syracuse University||Title: Research Associate||Department:||Responsibilities:|
|Years: 1981 to 1983||Employer: Indian Institute of Technology, Delhi||Title: Senior Scientific Officer||Department:||Responsibilities:|
|Years: 1978 to 1981||Employer: American College, Madurai, India||Title: Assistant Professor||Department:||Responsibilities:|
|Associations / Societies|
|Expert is a member of the American Vacuum Society and is listed in Who's Who in the East.|
|Publications and Patents Summary|
|He contributed more than twenty publications in his research areas.
|Expert speaks, reads, and writes the two principal languages of India, Hindi and Telugu.|
Fields of Expertise
thin film, thin-film coating process, thin-film application, surface analysis, thin-film analysis, thin-film property, thin-film electrical property, thin-film optical property, applied surface, hard coating, colorimetry, vacuum technology, vacuum deposition, physical vapor deposition, thin-film deposition, atomic layer deposition, anti-corrosive coating material, contactless torque sensor, torque, thin film science, ultrasonic cleaner, palladium chloride, surface characterization, stainless steel pipe, polyvinyl alcohol film, pipeline coating material, automation, thin-film sensor, indium tin oxide, electric resistivity, electric current measurement, absorption spectrum, titanium nitride, titanium nitride thin film, surface coating corrosion, high vacuum system, boiling-water nuclear reactor, torque sensor, optical spectroscopy, electrically conductive film, microhardness tester, wear prevention, static vacuum maintenance, vacuum leak detection, optically-selective coating material, atomic absorption spectroscopy, vacuum measurement, wear-resistant coating material, metal etching, ion etching, electroless plating process, electroplating, deposition, abrasion-resistant coating material, transparent conductive thin film, corrosion resistance, X-ray photoelectron spectroscopy, pressure sensor, hard material, vapor deposition, vacuum seal, vacuum pump, vacuum-compatible material, ultrasonic transducer, ultrasonic cleaning, ultra-high vacuum, tin (element), thick film, strain gage, stainless steel, sputter deposition, solid lubricant, scanning electron microscopy, polymer characterization, plating process, pipe, palladium, optical film, nickel, microhardness, metal polishing, metal degreasing, ion pump, hardness, evaporated film, dynamic vacuum seal, diffusion pump, dielectric film, coating, carbon steel, automotive coating material, Auger electron spectroscopy