Expert in X-ray Diffraction, Microscopy, Spectroscopy and Imaging
Specialties: X-ray Diffraction, Small angle x-ray scattering, Pair distribution function analysis, reflectivity and epitaxy, Spectroscopy (FTIR, Fluoroscence, Raman, EXAFS and XANES, SEM, Micro computer Tomography, Thermal gravimetry (TGA), chemical analysis and transport properties.
Material characterization at non-ambient conditions - interplanetary interior (ultra high-pressure, ultra high-temperature using resistive and infrared laser heating and ultra low temperature up to liquid helium
Expert may consult nationally and internationally, and is also local to the following cities: San Jose, California - San Francisco, California - Sacramento, California - Oakland, California - Stockton, California - Fremont, California - Modesto, California - Salinas, California - Santa Rosa, California - Hayward, California
|Year: 2005||Degree: Postdoctoral||Subject: Mineralogy||Institution: MIT|
|Year: 2003||Degree: Postdoctoral||Subject: Physics||Institution: Harvard|
|Years: 2008 to 2013||Employer: PANalytical||Title: Senior scientist||Department:||Responsibilities:|