Expert Details

Expert in X-ray Diffraction, Microscopy, Spectroscopy and Imaging

Expert ID: 731791 California, USA

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Experienced in synthesis and characterization of superconducting oxides, doped metal oxides, minerals, metals, nanocrytsalline materials, single crystals, polycrystalline and epitaxial films.

Specialties: X-ray Diffraction, Small angle x-ray scattering, Pair distribution function analysis, reflectivity and epitaxy, Spectroscopy (FTIR, Fluoroscence, Raman, EXAFS and XANES, SEM, Micro computer Tomography, Thermal gravimetry (TGA), chemical analysis and transport properties.

Material characterization at non-ambient conditions - interplanetary interior (ultra high-pressure, ultra high-temperature using resistive and infrared laser heating and ultra low temperature up to liquid helium



Expert may consult nationally and internationally, and is also local to the following cities: San Jose, California - San Francisco, California - Sacramento, California - Oakland, California - Stockton, California - Fremont, California - Modesto, California - Salinas, California - Santa Rosa, California - Hayward, California

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Year Degree Subject Institution
Year: 2005 Degree: Postdoctoral Subject: Mineralogy Institution: MIT
Year: 2003 Degree: Postdoctoral Subject: Physics Institution: Harvard

Work History

Years Employer Title Department Responsibilities
Years: 2008 to 2013 Employer: PANalytical Title: Senior scientist Department: Responsibilities:

Fields of Expertise

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