Expert Details

Expert in Solid State Electronics, Electromagnetics

Expert ID: 107942 Georgia, USA

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Expert has expertise in technologies, and in technology forecasting and technology management. Expert aids inventors, technologists, and high-tech start-up companies develop and position their technology assets for maximum economic benefit. He has extensive experience with patents, trademarks, copyrights, and other forms of intellectual property.

He has conducted research on the design, fabrication, and characterization of integrated devices and circuits. He engineered Motorola's oxide-isolated high voltage bipolar process, and built the world's first 100mm, dielectrically isolated production circuits. He helped design and implement new process control test dice for linear bipolar flows. He has compared methodologies for sidewall isolating epitaxial islands, and supervised the design of a vehicle to measure stresses induced in silicon chips. In addition, he is knowledgeable of molecular electronic devices and organic semiconductors.

He developed thin film resistors for use with data conversion products. Expert has performed ESD testing on many different circuits and devices using both Human Body Model and Machine Model simulators. He worked on design, layout, and processing changes to improve the hardness of the corresponding chips against these threats. He has published articles in this field, and has developed design rules for several companies.

Expert has extensive experience as a liaison between technologists and their patent attorneys to ensure that the client gets the best possible intellectual property from the underlying technology. He can perform patent searches. He also has worked as an inventor, as an expert witness in patent litigation, and as a negotiator in patent licensing matters.


He has spent a considerable portion of his professional career working at a major U.S. semiconductor house. He performed process development activities designed to create new circuits and devices. He also has an extensive background in both silicon and gallium arsenide.

Expert has employed Touchstone software to simulate both active and passive microwave circuits. He has also served as a technical evaluator for earlier versions of this software package. Much of his work with this program has involved the comparison of simulation results with those displayed by the actual, resulting hardware.

He has done solid-state design for both professional activities and hobby projects for many years. These design projects involved either digital or analog circuitry. He has extensive experience debugging circuits and troubleshooting and repair of solid-state electronics. He has done design, simulation, and fabrication of a variety of passive solid-state components including thin-film resistors, dielectric capacitors, and certain types of inductors.

He has extensive experience with many types of bipolar and MOS transistors, including everything from power devices to VLSI circuitry-sized devices. He has made transistors in a semiconductor manufacturing facility and has characterized the electrical properties of these devices using a variety of test equipment.

Expert has performed research involving radiation hardness evaluations of solid-state electronics. Some of this work required translating other test results into more "engineer friendly" languages. He has developed radiation hardening design rules and tutorial articles for engineers less familiar with this area of technology.


Expert may consult nationally and internationally, and is also local to the following cities: Atlanta, Georgia - Athens, Georgia - Macon, Georgia - Roswell, Georgia - Marietta, Georgia - Chattanooga, Tennessee

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Education

Year Degree Subject Institution
Year: 1980 Degree: PhD Subject: Electrical Engineering Institution: Georgia Institute of Technology
Year: 1976 Degree: MS Subject: Electrical Engineering Institution: Georgia Institute of Technology
Year: 1975 Degree: BS Subject: Electrical Engineering Institution: Georgia Institute of Technology

Work History

Years Employer Title Department Responsibilities
Years: 1995 to Present Employer: Undisclosed Title: Principal Department: Responsibilities:
Years: 1994 to 1995 Employer: McDonald & Hughes, Inc. Title: Principal Department: Responsibilities:
Years: 1991 to 1994 Employer: McDonald, Withers & Hughes, Inc. Title: Principal Department: Responsibilities:
Years: 1985 to 1991 Employer: Georgia Institute of Technology, Physical Sciences Laboratory Title: Senior Research Engineer Department: Responsibilities:
Years: 1980 to 1985 Employer: Motorola Semiconductor Products Sector, Mesa, AZ Title: Principal Staff Engineer Department: Responsibilities:
Years: 1975 to 1980 Employer: Georgia Institute of Technology Title: Graduate Research Assistant Department: Responsibilities:
Years: 1972 to 1974 Employer: Latrobe Steel Company, Latrobe, PA Title: Laborer Department: Responsibilities:

Career Accomplishments

Associations / Societies
He is a Senior Member of IEEE.
Awards / Recognition
He has received the Motorola Award of Excellence three times (1981-83).
Publications and Patents Summary
Expert has filed more than 35 patent disclosures concerned with semiconductor devices and related technologies. He holds the three fundamental patents on Motorola's thin film resistor manufacturing process, and has 11 other patents relating to various technologies.

Additional Experience

Expert Witness Experience
He has served as an expert witness in patent and product liability disputes. During the "patent" portion of his career, he worked as an inventor, as a negotiator in patent licensing meetings, and as an expert in patent and product litigation. For example, he served as an expert in patent litigation where the settlement to his client was in excess of $20 million. In addition, he has been the lead expert with a patent licensing program where the total licensing revenue to his client exceeded $70 million.
Frequently, he assists certain companies with specific patent-related projects. One of his contributions to these companies involves the identification of patent infringers and the subsequent preparation of the associated infringement analysis, claim charts, and related documents. In addition, he often assists with 35 U.S.C. x 102, x 103, x 112, and x 120 analyses. Sometimes, he performs both patent and literature searches for additional prior art in specific efforts to invalidate certain patents. Expert has good local access to an excellent technical library at a major university.

He has prepared affidavits describing the "state-of-the-art" in a variety of fields during specific periods of time. He has written a number of expert reports and has created many patent claim charts.

He has testified in Federal District Court and has experience with being deposed. He has served as an expert in the litigation of Lemelson v. Ford Motor Company et al., CV-N-92-613-ECR(PHA); Lemelson v. Chrysler et al., CV-N-92-545-ECR(PHA); Lemelson v. Mitsubishi, CV-N-92-118-ECR(PHA); Mitsubishi v. Lemelson, CV-N-93-380-HDM(PHA); Personalized Mass Media Corporation ("PMMC") v. The Weather Channel, Inc., et al., Civil Action No. 295-CV-242 (E.D. Va.); Li Second Family Limited Partnership v. Toshiba Corporation and Toshiba America Electronic Components, Inc., Civil Action No. 97-306-A; Ken Alexander v. DeRoyal Industries, Inc., Civil Action No. 3:95-CV-724; and, Q.SyS International, Inc. v. Information Concepts, Inc. and The NASDAQ Stock Market, Inc., Civil Action C-1-96-371 (S.D. Ohio).

Expert has excellent working relationships with a number of high-powered patent licensing and litigation law firms and can provide introductions for clients seeking such expertise.
Vendor Selection
He has experience locating vendors for semiconductors, electronic parts, patent, trademark, and copyright data, and software packages.

He has access to printed materials, personal contacts, as well as patent and literature databases.

Fields of Expertise

intellectual property, technology forecasting, technology management, bipolar integrated circuit, integrated circuit, integrated-circuit chip, integrated-circuit package, medium-scale integrated circuit, monolithic integrated circuit, thin-film resistor, electrostatic discharge, electrostatic discharge control, electrostatic discharge testing, radiation hardness, legal patenting, patent, patent law, semiconductor chip, semiconductor device, semiconductor material processing, Touchstone software, solid-state electronics science, passive microwave circuit, passive solid-state component, transistor, electronics radiation hardening, radiation hardened device, international patent law, royalty rate, radiation testing, computer software licensing, discrete semiconductor device, chip-to-package interconnection, ion-beam etching, semiconductor device package, chip shooter, semiconductor device electrostatic discharge protection, electrostatic discharge damage interpretation, silicon processing, electrostatic discharge control plan, semiconductor defect analysis, semiconductor integrated processing, semiconductor device reliability, inventions, patent cost reduction, plastic semiconductor device package, technology innovation, semiconductor material manufacturing, device patenting, flip chip, technology transfer, complementary metal-oxide semiconductor device, electron-beam lithography, very large-scale integrated circuit, junction transistor theory, integrated circuit testing, integrated-circuit design software, ion etching, ceramic package, monolithic microwave integrated circuit, electrical science, trademark, gallium arsenide semiconductor, Zener breakdown, metal-oxide semiconductor field-effect transistor, large-scale integration, insulated field-effect transistor, solid-state device, process inventing, device inventing, high-voltage material, radiation hardening, thin-film capacitor, static electricity, silicon, semiconductor doping, semiconductor diode, nuclear hardening, microlithography, junction field-effect transistor, field-effect integrated circuit, electronic device reliability, dielectric breakdown, bipolar transistor, antistatic agent

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