Find an Expert
Scanning Probe Microscopy (AFM, STM, Kelvin Probe)
Application of Scanning Probe techniques for studying surfaces and interfaces properties at atomic and molecular scale, such as structural, electronic, mechanical properties and chemical composition. Instrument developments: UHV STM, combined UHV AFM/STM based on tuning fork sensor, STM/TEM instruments, Spin-polarized…
Monte Carlo, electron optics, Materials, Surfaces, Software, Matlab, Image Processing
Expert has worked in Auger electron spectroscopy (AES) and Scanning Auger Microscopy (SAM) for over 25 years. He was one of the originators of the application of multispectral techniques to the study of SAM Images. He has used advanced image…
Nanotechnology, Solar Cells, Thin Films and Science/HigherEd Policy
Engineered materials for nanosensor and solar energy conversion applications. Si-ink, Graphene, organic semiconductors, nanocrystalline silicon. Current research focus is to develop cost-effective photovoltaic technologies using both organic and inorganic materials. Played key role in establishing multi-million dollar research effort in…